Instruments

Preparation and fabrication

UHF exfo + cleanrooms

Ultra High Resolution Transmission Electron Microscope - Jeol JEM-2100Plus

Ultra High Resolution Transmission Electron Microscope (UHR-TEM) JEOL JEM-2100Plus 

UHV system for photoemission and surface analysis - SPECS

SPECS ultra-high vacuum system for sample characterization by methods of

Integrated SPM with Raman spectrometer for TERS - HR Evo Nano

Horiba LabRAM HR Evolution - 800 focal length Raman spectrometer

Specs:

Cryogenic confocal Raman microscope - attoRAMAN

attocube attoRAMAN Cryogenic confocal Raman microscope

• ultra-high throughput spectrometer including a peltier cooler - temperature 2-400 K
• 532nm and 633 nm excitation wavelength
• magnetic field of up to 15 T
• back-illuminated CCD

Confocal Raman Microscopy System - WITec alpha300 R

WITec alpha300 R Confocal Raman Microscopy System

Specs:

• 532 and 633 nm excitation wavelength
• 10x, 50x, 100x high NA objectives
• Piezo XYZ stage (200x200x20 μm)
• Gratings: 600, 1800 l/mm
• Stokes/anti-Stokes and Low-frequency Raman spectroscopy option for 633 nm excitation

Raman Microscopy System - Horiba LabRam HR

Specs:

UV/Vis/NIR spectrometer - Perkin-Elmer Lambda 1050

• 175 - 3300 nm wavelength range
• 3 detectors: Photomultiplier / Peltier-cooled InGaAs / Peltier-cooled PbS
• 60 mm spectralon integration sphere - 2 detectors (PMT / PbS)
• Spectroelectrochemical cuvette for the use both in trasnmission and reflectance
• Spectroelectrochemical cell for the use in transmission
• Electrochemical studies controlled by

Fluorescence spectrometer - Fluorolog 3

HORIBA Jobin-Yvon Fluorolog 3

• excitation: Mercury lamp / KOHERAS Supercontinuum Laser
• Inverted Olympus BX microscope 

-- Installed 2011  --

Atomic Force Microscope - Bruker Dimension Icon

Bruker Dimension Icon AFM

Specs:

• PeakForce QNM with ScanAsyst
• PeakForce TUNA
• PeakForce KPFM
• Electrochemistry (ECAFM) with temperature control
• 35 um x 35 um piezo range
• >100pm xyz resolution

-- Installed 2012 --