Instruments
Combined STM/nc-AFM - SPECS Aarhus 150
SPECS Scanning Probe Microscope Aarhus 150
Features:
Contact person: Martin Kalbáč
Location: 2nd floor, lab 207
Dual magnetron sputterer - Quorum Q300T
Quorum Q300T D dual magnetron sputterer
Features:
- Vacuum pressure of up to 5x10⁻⁵ mbar
- Dual sputter head for in-situ sequential coating of samples (Ø up to 150 mm) with different metals
- Capable of sputtering non-oxidizing and oxidizing metals e.g. Cr, Ir, W, Al, Ti, Au, Pt
Contact person: Martin Kalbáč
Location: Cleanroom
Schottky Field Emission Scanning Electron Microscope - Jeol JSM-IT800
Jeol JSM-IT800SHL Schottky Field Emission Scanning Electron Microscope (SEM) with Raman spectroscopy capabilities
Features:
- Schottky Field-Emission SEM
- Energy Dispersive X-ray Spectrometer (EDS)
- Secondary (SE) and back-scattered (BS) electrons detection
- Raman-SEM capabilities
Specs:
Contact person: Martin Kalbáč
Location: Basement
Scanning Near-Field Optical Microscope - attocube neaspec
attocube neaspec VIS-neaSCOPE+s Scanning Near-Field Optical Microscope (SNOM)
Specs:
- Excitation wavelengths: He-Ne: 633 nm
- Tapping mode AFM
- s-SNOM
Contact person: Otakar Frank
Location: Basement, room 08, tel.: +420 266 052 101
Microscale characterization
Ramans - don't forget to get info on Matej's SMS, fluorolog with microscope, ellipsommetry